By Datamonitor March 11, 2008
IBM has signed a two-year agreement with Hitachi that will see the companies implement a joint semiconductor metrology research program aimed at improving IBM's semiconductor technology. The two companies, which are currently working together on enterprise servers and other products, hope that combining their individual capabilities and intellectual property will reduce the costs associated with developing the next-generation of chip technology. The research program will focus on the development of 32- and 22-nanometer devices. As part of the collaboration, IBM and Hitachi will use new methods to analyze semiconductor devices and improve the characterization and measurement of transistor variation.
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